Measuring the Power Dissipation Capability of High-Voltage, Low-Capacitance Ceramic Chip Capacitors

This paper describes a successful strategy for measuring the power dissipated by high-voltage, low-capacitance ceramic chip capacitors at frequencies typical of switch-mode power supplies. For these devices, the simpler techniques employed to measure the power dissipation of highcapacitance tantalum and aluminum devices prove inadequate, and a more fundamental approach is required. The various measurement complications presented by high-voltage, low-capacitance ceramic chip capacitors are explored. Test circuitry is described that facilitates the necessary measurements. Representative raw and processed test data are presented to fully demonstrate the technique. Finally, general observations are made about the electrical and thermal performance of this class of ceramic chip capacitors.